The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Mar. 11, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jongyoung Lee, Seoul, KR;

Dongyoon Kim, Hwaseong-si, KR;

Minhyouk Kim, Hwaseong-si, KR;

Jihyuk Oh, Suwon-si, KR;

Insu Choi, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01); G06F 12/1036 (2016.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 11/073 (2013.01); G06F 9/45558 (2013.01); G06F 11/0772 (2013.01); G06F 11/1016 (2013.01); G06F 12/1036 (2013.01); G06F 2009/45583 (2013.01);
Abstract

A method of operating a system running a virtual machine that executes an application and an operating system (OS) includes performing first address translation from first virtual addresses to first physical addresses, identifying faulty physical addresses among the first physical addresses, each faulty physical address corresponding to a corresponding first physical address associated with a faulty memory cell, analyzing a row address and a column address of each faulty physical address and specifying a fault type of the faulty physical addresses based on the analyzing of the row address and the column address of each faulty physical address, and performing second address translation from second virtual addresses to second physical addresses based on a faulty address, thereby excluding the faulty address from the second physical addresses.


Find Patent Forward Citations

Loading…