The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

May. 07, 2020
Applicant:

Luminar, Llc, Orlando, FL (US);

Inventors:

Amey Sutavani, Mountain View, CA (US);

Lekha Walajapet Mohan, Palo Alto, CA (US);

Benjamin Englard, Palo Alto, CA (US);

Assignee:

Luminar, LLC, Orlando, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 17/931 (2020.01); G01S 17/86 (2020.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4972 (2013.01); G01S 17/42 (2013.01); G01S 17/86 (2020.01); G01S 17/931 (2020.01);
Abstract

A system includes multiple sensors having different, and overlapping, fields of regard and a controller communicatively coupled to sensors. Methods for calibrating the multiple sensors include obtaining data from the sensors, determining optimized transformation parameters for at least one of the sensors, and transforming the data from one sensor projection plane to the other sensor projection plane. The method is an iterative process that uses the metric of mutual information between the data sets, and transformed data sets of the sensors, to determine an optimized set of transformation parameters. The sensors may be a plurality of lidar sensors, a camera and a lidar sensor, or other sets of sensors.


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