The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Jan. 18, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takenori Okusa, Tokyo, JP;

Yoshihiro Yamashita, Tokyo, JP;

Shunsuke Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00613 (2013.01); G01N 2035/00356 (2013.01);
Abstract

It is necessary to dispose a plurality of units which have different target temperatures on an apparatus in a more integrated state in order to improve analysis performance and processing capacity per unit space of the apparatus. Therefore, it is necessary to mitigate influence of temperature exerted between units. It is possible to reduce the temperature influence exerted between the units and thus efficiently control temperature by properly disposing the units in the apparatus, based on the relationship between a use environment temperature of the apparatus and a target temperature of each unit and temperature accuracy required for the unit.


Find Patent Forward Citations

Okusa, Takenori. (2022). Automated analyzer (U.S. Patent No. 11360108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11360108

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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