The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Oct. 02, 2018
National University Corporation Tokai National Higher Education and Research System, Nagoya, JP;
Toray Industries, Inc., Tokyo, JP;
Kyowa Industrial Co., Ltd., Sanjo, JP;
Atsuhiko Yamanaka, Aichi, JP;
Mariko Terada, Aichi, JP;
Yukitane Kimoto, Aichi, JP;
Koji Shiraki, Shizuoka, JP;
Yuji Hotta, Aichi, JP;
Daisuke Shimamoto, Aichi, JP;
NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM, Nagoya, JP;
TORAY INDUSTRIES, INC., Tokyo, JP;
KYOWA INDUSTRIAL CO., LTD., Sanjo, JP;
Abstract
A method for measuring a fiber orientation degree includes: irradiating a sample formed of a composite material containing discontinuous carbon fibers with an X-ray to acquire an X-ray diffraction image; calculating an angle (2θ)of a peak originating from a crystal face of graphite; calculating a correction coefficient δ of a thickness of the sample; calculating an upper limit (2θ)of the peak of the crystal face of graphite; calculating a diffraction sensitivity I(ϕ) of the peak originating from the crystal face of graphite by correcting an integrating range with the correction coefficient δ and integrating the X-ray diffraction image with respect to a diffraction angle (2θ); and calculating a fiber orientation degree Sd(β) by the method of Hermans from the diffraction sensitivity I(ϕ).