The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Jan. 20, 2022
Carl Zeiss Spectroscopy Gmbh, Jena, DE;
Joerg Margraf, Koenigsee—Rottenbach, DE;
CARL ZEISS SPECTROSCOPY GMBH, Jena, DE;
Abstract
A measurement arrangement for measuring diffusely reflected light and specularly includes a measurement light source for generating measurement light, an optical receiver for receiving measurement light, and a first mirror for reflecting the measurement light emerging from the measurement light source. The measurement arrangement additionally comprises a second mirror for reflecting diffusely reflected measurement light to the optical receiver. A settable third mirror is also provided, which in a first position is aligned for directing the measurement light that was directed onto a sample by the first mirror and specularly reflected by the sample to the optical receiver. The third mirror in a second position releases a beam path between the second mirror and the optical receiver, so that the measurement light directed onto the sample by the first mirror and diffusely reflected by the sample to the second mirror is directed to the optical receiver by the second mirror.