The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Jul. 24, 2020
Applicant:
Olympus Scientific Solutions Americas Corp., Waltham, MA (US);
Inventor:
Andrew Thomas, Waltham, MA (US);
Assignee:
Olympus Scientific Solutions Americas Corp., Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01N 29/11 (2006.01); G01N 29/14 (2006.01); G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
G01B 17/02 (2013.01); G01N 29/11 (2013.01); G01N 29/14 (2013.01); G01N 29/4427 (2013.01);
Abstract
Examples of the present subject matter provide techniques for measuring thicknesses of materials using one or more acquisition cycles. The data from the one or more acquisition cycles may be amplified using a specified gain across the signal response, converted to a digital signal, and stored in a memory. The digital signal may be retrieved from memory, and signal processing techniques using one or more time-variable threshold(s) may be used to calculate one or more thickness(es) of the testing object.