The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Jun. 15, 2018
Applicant:

Korloy Inc., Seoul, KR;

Inventors:

Je-hun Park, Cheongju-si, KR;

Seung-su Ahn, Cheongju-si, KR;

Seong-mo Park, Cheongju-si, KR;

Jin-han Gwon, Cheongju-si, KR;

Kyoung-il Kim, Cheongju-si, KR;

Beom-sik Kim, Cheongju-si, KR;

Sun-yong Ahn, Cheongju-si, KR;

Assignee:

KORLOY INC., Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/06 (2006.01); C23C 14/32 (2006.01); C23C 28/00 (2006.01); C23C 28/04 (2006.01);
U.S. Cl.
CPC ...
C23C 14/0641 (2013.01); C23C 14/325 (2013.01); C23C 28/04 (2013.01); C23C 28/042 (2013.01); C23C 28/044 (2013.01); C23C 28/34 (2013.01); C23C 28/345 (2013.01); C23C 28/347 (2013.01);
Abstract

The present invention relates to a hard film having improved wear resistance and improved toughness. A hard film according to the present invention is formed by using a PVD method on a surface of a base material, wherein: the hard film includes a first hard layer and a second hard layer; the first hard layer has a thickness of approximately 0.1-3.0 μm and is composed of TiAlN (0.3≤a≤0.7), and has a single phase structure; and the second hard layer has a thickness of approximately 0.5-10 μm and is composed of TiAlMeN (0.3≤a≤0.7, 0≤b≤0.05, the Me being at least one selected from V, Zr, Si, Nb, Cr, Mo, Hf, Ta and W); according to an XRD phase analysis method, a ratio ([200]/[111]) of the intensity of a [200] peak to the intensity of a [111] peak is approximately 1.5 or higher; the second hard layer preferentially grows in a [200] direction; the [200] peak is located at approximately 42.7°-44.6° and is composed of three phases, and the [111] peak is located at approximately 37.0°-38.5° and is composed of three phases; and when a peak having a largest intensity among the peaks of the three phases is a main peak and remaining peaks are sub-peaks, a ratio (main peak/sub-peaks) of the intensity of the main peak to the intensities of the sub-peaks in a [200] face is approximately 2 or higher, and a ratio (main peak/sub-peaks) of the intensity of the main peak to the intensities of the sub-peaks in a [111] face is approximately 2 or higher.


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