The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Dec. 21, 2019
Applicant:

Technische Universiteit Eindhoven, Eindhoven, NL;

Inventors:
Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); C12Q 1/6825 (2018.01); G01N 33/542 (2006.01); G01J 3/44 (2006.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6825 (2013.01); G01J 3/4412 (2013.01); G01N 33/542 (2013.01); G01N 33/543 (2013.01); G01N 33/5436 (2013.01); G01N 33/54326 (2013.01); G01N 33/54353 (2013.01); G01N 33/54373 (2013.01); C12Q 2563/149 (2013.01); G01N 21/63 (2013.01);
Abstract

A method for sensing an analyte uses tethered particle motion. A functionalized particle has a first state in which the functionalized particle is bound to the surface and a second state in which the functionalized particle is not bound to the surface, where the functionalized particle switches between the first and second states depending on the presence and absence of the analyte, thereby changing motion characteristics of the functionalized particle depending on the presence of the analyte. A spatial coordinate parameter of the functionalized particle is measured by a detector, and a processor determines the presence/concentration of the analyte from changes in the measured spatial coordinate parameter.


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