The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Sep. 04, 2017
Komori Corporation, Tokyo, JP;
Hiromitsu Numauchi, Tsukuba, JP;
KOMORI CORPORATION, Tokyo, JP;
Abstract
The present invention is a method for measuring the varnish film thickness of a printed article by obtaining the film thickness of varnish on a sheet () on which a pattern is printed on a base thereof with ink and the pattern is coated with the varnish, wherein a metal foil () having a smooth surface is attached to the base of the sheet (), and the film thickness of the varnish coated directly over the metal foil () is detected with a spectral interference-type film thickness meter () so as to determine whether the film thickness of the varnish is acceptable or not on the basis of the results detected by the spectral interference-type film thickness meter ().