The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Nov. 07, 2016
Applicant:

Schneider Gmbh & Co. KG, Fronhausen, DE;

Inventors:

Gunter Schneider, Marburg, DE;

Stephan Huttenhuis, Niederweimar, DE;

Assignee:

SCHNEIDER GMBH & CO. KG, Fronhausen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B24B 13/00 (2006.01); B29D 11/00 (2006.01); B24B 27/00 (2006.01); C03C 19/00 (2006.01);
U.S. Cl.
CPC ...
B24B 13/0037 (2013.01); B24B 27/0023 (2013.01); B29D 11/00423 (2013.01); C03C 19/00 (2013.01);
Abstract

A method, an installation and a system for processing optical workpieces in which workpieces are conveyed to individual processing apparatus or processing lines corresponding to an assignment. The respective assignment preferably takes into consideration assignment parameters, such as the availability and capability of processing apparatus and/or processing lines. The assignment that already has been carried out is examined before the actual or ultimate conveying and/or when there is a change in the assignment parameters and optionally is changed in a corresponding manner, taking into consideration the current assignment parameters, in order to adapt to current circumstances. As an alternative or in addition, jobs for processing workpieces are forwarded to the processing installations at different sites based on corresponding assignment parameters. Optionally, an examination and, as appropriate, a change in the assignment are made when new jobs or significant changes in the assignment parameters are detected.


Find Patent Forward Citations

Loading…