The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Apr. 11, 2018
Applicant:
Massachusetts Institute of Technology, Cambridge, MA (US);
Inventors:
Heng Yang, Cambridge, MA (US);
Brian W. Anthony, Cambridge, MA (US);
Felix Jan van de Donk, Eindhoven, NL;
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01); B06B 1/04 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/4209 (2013.01); A61B 8/429 (2013.01); A61B 8/4245 (2013.01); A61B 8/4494 (2013.01); A61B 8/54 (2013.01); B06B 1/045 (2013.01); G01S 15/8918 (2013.01);
Abstract
A mechanical vibration source for a shear wave elastography system has a contact surface shaped to provide a point source of mechanical energy when striking a target surface of a medium. This point source usefully mitigates high frequency components and other artifacts in an induced shear wave. Other techniques may be used in combination with this mechanical energy source to improve shear wave elastography and facilitate miniaturization for deployment, e.g., within a handheld imaging device.