The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Jan. 31, 2020
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Takeshi Noda, Ebina, JP;
Yoshihito Machida, Sagamihara, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G01N 23/046 (2018.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/461 (2013.01); A61B 6/469 (2013.01); A61B 6/481 (2013.01); A61B 6/482 (2013.01); A61B 6/503 (2013.01); A61B 6/504 (2013.01); A61B 6/5205 (2013.01); A61B 6/5217 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G06T 5/002 (2013.01); G06T 5/004 (2013.01); G06T 5/008 (2013.01); G06T 5/50 (2013.01); A61B 6/4233 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/612 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/30004 (2013.01);
Abstract
An information processing apparatus comprises: an obtainment unit configured to obtain a radiation image of a subject; a generation unit configured to generate, based on a plurality of radiation images obtained by radiation of mutually different spectra, a material characteristic image in which a region for each material can be extracted from the interior of the subject; and an image processing unit configured to perform processing of enhancing or attenuating, based on a position of a specific region in the material characteristic image, the specific region in the radiation image.