The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Oct. 08, 2019
Applicant:
Merry Electronics (Shenzhen) Co., Ltd., Guangdong, CN;
Inventors:
Assignee:
MERRY ELECTRONICS (SHENZHEN) CO., LTD., Guangdong, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/12 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/123 (2013.01); A61B 5/7203 (2013.01); A61B 5/7475 (2013.01); A61B 5/6898 (2013.01); A61B 2560/0242 (2013.01); A61B 2562/0204 (2013.01); H04R 2225/41 (2013.01);
Abstract
A method for a hearing test includes receiving a first testing hearing threshold for a subject at a first frequency under a first background noise level; calculating a first testing signal-to-noise ratio (SNR) between the first testing hearing threshold and the first background noise level; responsive to the first testing SNR, receiving a first adjusted hearing threshold; and responsive to the first adjusted hearing threshold, modifying a first hearing test result of the first frequency.
Chang, Hung-Yue. (2022). Method for hearing test and hearing test system (U.S. Patent No. 11357424). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11357424
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile