The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Apr. 14, 2021
Applicant:

Anokiwave, Inc., San Diego, CA (US);

Inventors:

Jason Leo Durbin, San Diego, CA (US);

Andrew Michael Street, Groton, MA (US);

Assignee:

Anokiwave, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/08 (2006.01); H04B 7/06 (2006.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 7/086 (2013.01); H04B 7/0639 (2013.01); H04B 17/21 (2015.01);
Abstract

A selective calibration system for signal processing integrated circuits includes a calibration information generator that receives information identifying a group of signal processing integrated circuits associated with a product, the group of signal processing integrated circuits being a subset of a population of signal processing integrated circuits for which performance information is stored, and uses the performance information to produce calibration information for the identified signal processing integrated circuits as a group. The calibration information generator generally uses only performance information associated with the identified signal processing integrated circuits to produce the calibration information so that each signal processing integrated circuit in the group is calibrated relative to just that group of signal processing integrated circuits. Direct product access to the calibration information generator can be provided.


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