The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Oct. 31, 2018
Amlogic (Shanghai) Co., Ltd., Shanghai, CN;
AMLOGIC (SHANGHAI) CO., LTD., Shanghai, CN;
Abstract
The invention provides a method for calibrating crystal frequency offset through an internal loop of a central processing unit (CPU), which comprises: outputting an oscillation exciting signal to a crystal circuit by the CPU; producing a clock signal by the crystal circuit; outputting the clock signal through an output port arranged on the CPU by the internal loop; and adopting and connecting a frequency meter to the output port, and receiving and testing the clock signal to obtain a testing result; determining whether a deviation of the clock signal is qualified; if it is qualified, the tester exits subsequently, otherwise the tester regulates the crystal circuit, and then turning to Step S. The clock signal of the CPU is output at the output port through the internal loop, and then the frequency meter is used for measuring the clock without being influenced by a probe, and the measurement is more accurate.