The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Jun. 19, 2019
Nxp B.v., Eindhoven, NL;
Andreas Lentz, Buchholz, DE;
Stefan Heyse, Quickborn, DE;
Martin Heinrich Butkus, Hamburg, DE;
Oliver Alexander Schmidt, Hamburg, DE;
NXP B.V., Eindhoven, NL;
Abstract
A fully digital method and apparatus are provided for detecting glitches on a monitored line by providing a toggle signal to an initial delay circuit and a plurality of delay elements formed with standard logic cells so that logic values from the delay elements are captured in a corresponding plurality of clocked capture flops to provide a digitized representation of a delay value during a sampling period which is converted to a numerical measurement result which is evaluated against a reference value to generate an output error signal if a difference between the numerical measurement result and reference value exceeds a programmable margin, where the initial delay circuit is configured with a trim setting to impose an initial delay to compensate for process variations and where the reference value is adapted over a plurality of sampling periods to compensate for temperature effects on the numerical measurement result.