The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Dec. 11, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Luke Joseph Himbele, Tokyo, JP;

Yasushi Sonoda, Tokyo, JP;

Takashi Uemura, Tokyo, JP;

Tomoyoshi Ichimaru, Tokyo, JP;

Junya Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/3065 (2006.01); F16K 31/12 (2006.01); F16K 31/06 (2006.01); F16K 51/02 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32449 (2013.01); C23C 16/45536 (2013.01); F16K 31/0603 (2013.01); F16K 31/12 (2013.01); F16K 51/02 (2013.01); H01J 37/32192 (2013.01); H01L 21/3065 (2013.01); F16K 31/0675 (2013.01);
Abstract

The present invention is a plasma processing apparatus that includes a processing chamber where plasma processing is performed on a sample, a radio frequency power supply that supplies radio frequency power to generate plasma, a sample stage on which the sample is placed, and a gas supply unit that supplies a gas to the processing chamber. The gas supply unit includes a first pipe that supplies a first gas as a gas for etching process to the processing chamber, a second pipe that supplies a second gas as a gas for etching process to the processing chamber, and a third pipe through which a third gas as a gas for deposition process flows. The third pipe is coupled to the second pipe. A fourth valve is arranged on the second pipe. The fourth valve prevents the third gas from flowing in a direction toward a supply source of the second gas.


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