The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Aug. 01, 2021
Applicants:

Zhongwei Chen, Los Altos Hills, CA (US);

Xiaoming Chen, Sunnyvale, CA (US);

Daniel Tang, Fremont, CA (US);

Liang-fu Fan, Fremont, CA (US);

Inventors:

Zhongwei Chen, Los Altos Hills, CA (US);

Xiaoming Chen, Sunnyvale, CA (US);

Daniel Tang, Fremont, CA (US);

Liang-Fu Fan, Fremont, CA (US);

Assignee:

BORRIES PTE. LTD., Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01); H01J 37/20 (2006.01); H01J 37/317 (2006.01); H01J 37/141 (2006.01);
U.S. Cl.
CPC ...
H01J 37/28 (2013.01); H01J 37/141 (2013.01); H01J 37/20 (2013.01); H01J 37/3174 (2013.01); H01J 2237/0216 (2013.01); H01J 2237/0453 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/20264 (2013.01); H01J 2237/20278 (2013.01);
Abstract

The present invention provides a driving system comprising two actuators for moving a stage through two elastic connectors; and a general apparatus/device comprising such a driving system, such as a machine tool, an analytical instrument, an optical microscope, and an apparatus of charged-particle beam such as electron microscope and an electron beam lithographical apparatus. When used in an electron microscope, the stage can be used as a specimen stage or a plate having apertures for electron beam to pass through. The novel stage driving system exhibits numerous technical merits such as simpler structure, better manufacturability, improved cost-effectiveness, and higher reliability, among others.


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