The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Dec. 30, 2020
Applicant:
Snap Inc., Santa Monica, CA (US);
Inventors:
Sergey Tulyakov, Marina del Rey, CA (US);
Roman Furko, Marina del Rey, CA (US);
Aleksei Stoliar, Marina del Rey, CA (US);
Assignee:
Snap Inc., Santa Monica, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/10 (2022.01); G06K 9/62 (2022.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06T 11/60 (2006.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06V 40/10 (2022.01); G06K 9/6257 (2013.01); G06K 9/6259 (2013.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06T 11/60 (2013.01); G06V 20/40 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01); G06V 2201/07 (2022.01);
Abstract
A landmark detection system can more accurately detect landmarks in images using a detection scheme that penalizes for dispersion parameters, such as variance or scale. The landmark detection system can be trained using both labeled and unlabeled training data in a semi-supervised approach. The landmark detection system can further implement tracking of an object across multiple images using landmark data.