The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Feb. 09, 2021
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Hyun Cheol Kim, Sejong-si, KR;

Hyuk Min Kwon, Daejeon, KR;

Jeong Il Seo, Daejeon, KR;

Sang Woo Ahn, Daejeon, KR;

Seung Jun Yang, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06T 17/00 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06F 17/18 (2013.01);
Abstract

Disclosed herein a method of removing a point cloud outlier and an apparatus implementing the method. The method includes: arranging a point cloud obtained from a laser scanner along at least a first direction; selecting, neighboring first-axis points, between which a separation degree satisfies an inspection start threshold condition, as a first leading-side representative point and a first trailing-side representative point; selecting a first leading-side outlier candidate and a first trailing-side outlier candidate based on a first leading-side separation degree and a first trailing-side separation degree; and determining the first leading-side outlier candidate and the first trailing-side outlier candidate as a first outlier point, when the number of the outlier candidates satisfies an allowable threshold condition.


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