The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Nov. 20, 2020
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Jakub Hladik, Senica, SK;

Martin Konecny, Troubsko, CZ;

Neal Anthony Muggleton, Stevenage, GB;

Jan Riha, Brno, CZ;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 17/20 (2006.01); A62B 18/02 (2006.01); G06T 15/20 (2011.01); G06Q 10/06 (2012.01); G06T 15/00 (2011.01); G06N 3/08 (2006.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 15/205 (2013.01); A62B 18/02 (2013.01); G06N 3/08 (2013.01); G06Q 10/06395 (2013.01); G06T 15/005 (2013.01); G06T 17/20 (2013.01); G06V 40/165 (2022.01); G06T 2207/30201 (2013.01);
Abstract

Apparatuses, methods, and computer program products for safety compliance determinations are provided. An example method includes receiving three-dimensional (3D) image data indicative of a field of view of a 3D imager that includes a first user upon which to perform a compliance determination. The method further includes generating a fit parameter associated with a safety device of the first user within the field of view of the 3D imager based upon the 3D image data, the fit parameter indicative of an associated positioning of the safety device relative to the first user. The method also includes comparing the fit parameter with a compliance threshold associated with the safety device and generating an alert signal in an instance in which the fit parameter fails to satisfy the compliance threshold. In some instances, the method may supply the 3D image data to an artificial neural network to generate the fit parameter.


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