The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Oct. 11, 2020
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Yanli Song, Shanghai, CN;

Xin Zhou, Shanghai, CN;

Xiaodan Xing, Shanghai, CN;

Gang Chen, Shanghai, CN;

Qiang Li, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); A61B 6/5282 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method for generating a trained neural network model for scanning correction corresponding to one or more imaging parameters is provided. The trained neural network model may be trained using training data. The training data may include at least one first set of training data. The first set of training data may be generated according to a process for generating the first set of training data. The process may include obtaining a first image and a second image corresponding to the one or more imaging parameters. The second image may include less scattering noises than the first image. The process may further include determine the first set of training data based on the first image and the second image.


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