The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Jun. 24, 2020
Flir Systems, Inc., Wilsonville, OR (US);
Zhongwei Xu, Tampere, FI;
Alessandro Foi, Tampere, FI;
Teledyne FLIR, LLC, Thousand Oaks, CA (US);
Abstract
Techniques are disclosed for point cloud denoising systems and methods. In one example, a method includes determining a respective local coordinate system for each point of a point cloud. The method further includes determining a respective first adaptive-shape neighborhood for each point of the point cloud based on each respective local coordinate system. The method further includes performing filtering associated with each respective first adaptive-shape neighborhood to obtain a respective second adaptive-shape neighborhood for each point of the point cloud. The method further includes determining local estimates for points inside each of the second adaptive-shape neighborhoods. The method further includes aggregating the local estimates for each point of the point cloud to obtain a denoised point cloud. Related devices and systems are also provided.