The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

May. 18, 2020
Applicant:

Kaskada, Inc., Seattle, WA (US);

Inventors:

Davor Bonaci, Seattle, WA (US);

Benjamin Chambers, Seattle, WA (US);

Andrew Concordia, Seattle, WA (US);

Emily Kruger, Seattle, WA (US);

Ryan Michael, Seattle, WA (US);

Assignee:

KASKADA, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/28 (2019.01); G06N 5/02 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/284 (2019.01); G06N 5/02 (2013.01); G06N 5/04 (2013.01);
Abstract

Machine learning feature engineering systems and methods comprise an event ingestion module that receives event data associated with entities. The ingestion module determines which entities are associated with events of the event data. The ingestion module stores the events, grouped by associated entity, in a related event store. A user defines features associated with the entities via an API and/or a feature studio. A feature computation layer determines values for the features based on the grouped events stored to the related event store. The feature computation layer stores the computed feature values and timestamps to a feature store. When new data is received, the feature computation layer computes one or more of the feature values for different times based on the timestamps. Feature vectors are generated using the computed feature values and output to the user via the API and/or feature studio.


Find Patent Forward Citations

Loading…