The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Sep. 09, 2021
Zhangjiakou Cigarette Factory Co., Ltd, Zhangjiakou, CN;
Bo Liu, Zhangjiakou, CN;
Zijuan Li, Zhangjiakou, CN;
Jia Sun, Zhangjiakou, CN;
Hang Yin, Zhangjiakou, CN;
Yang Gao, Zhangjiakou, CN;
Liyuan Zhao, Zhangjiakou, CN;
Wangchang Miao, Zhangjiakou, CN;
Jiaojiao Chen, Zhangjiakou, CN;
Zixian Feng, Zhangjiakou, CN;
Zheng Zhou, Zhangjiakou, CN;
Xiaohui Jia, Zhangjiakou, CN;
Chao Li, Zhangjiakou, CN;
Zhangjiakou Cigarette Factory Co., Ltd, Zhangjiakou, CN;
Abstract
A system and a method for on-line analysis of a structure of dried shredded tobacco are provided. The system includes a shredded tobacco structure on-line analysis module, a shredded tobacco filling capacity prediction model module, and an early-warning module. The shredded tobacco structure on-line analysis module includes a sample extraction unit, a sample analysis unit and a shredded tobacco filling capacity data acquisition unit. The shredded tobacco filling capacity prediction model module includes a model parameter screening unit and a model construction unit. An early-warning threshold is provided in the early-warning module, and when a deviation of a predicted shredded tobacco filling capacity from a standard value exceeds the early-warning threshold, an alarm is given. The new system is an intelligent system with functions of shredded tobacco structure analysis, shredded tobacco filling capacity prediction, and abnormality early-warning determination and analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile