The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Oct. 11, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jia Yu, Beijing, CN;

Jia Tian Zhong, Beijing, CN;

Xing Xing Shen, Beijing, CN;

Zhan Peng Huo, Beijing, CN;

Zhi Li Guan, Beijing, CN;

Peng Hui Jiang, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2457 (2019.01); G06F 16/248 (2019.01); G06F 16/22 (2019.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 16/2228 (2019.01); G06F 16/248 (2019.01); G06N 7/005 (2013.01);
Abstract

A method and system for determining causes. The method includes generating a set of cause indices. Each cause index includes a cause, at least one pattern, and a probability of the cause for the pattern. The method also includes receiving a data set, and determining that one or more indexed patterns match a pattern in the data set. Further, the method includes retrieving causes for the indexed patterns that match the pattern in the data set, as well as determining probabilities of the retrieved causes for the pattern in the data set.


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