The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Nov. 02, 2020
Applicant:

Workday, Inc., Pleasanton, CA (US);

Inventors:

Kishore Kumar Pusukuri, Santa Clara, CA (US);

Anant Rao, Fremont, CA (US);

Assignee:

Workday, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/215 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/285 (2019.01);
Abstract

A system for outlier detection and removal comprises an interface and a processor. The interface is configured to receive a data set. The processor is configured to determine a cleaned data set by removing outliers, wherein determining the cleaned data set comprises determining a type of distribution, in response to the type of distribution being normal, determining the outliers using covariance estimation, in response to the type of distribution not being normal, determining the outliers using density based clustering, and determining the cleaned data set by removing the outliers from the data set, determine a coefficient of variation of the cleaned data set, determine whether the coefficient of variation is greater than a threshold coefficient of variation, and in response to the coefficient of variation being greater than the threshold coefficient of variation, determine a new cleaned data set by removing a new set of outliers from the cleaned data set.


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