The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Mar. 09, 2021
Sap SE, Walldorf, DE;
Manoj Karthick D O, Bangalore, IN;
SAP SE, Walldorf, DE;
Abstract
Technologies are provided for automated exploratory testing using machine learning. In response to receiving an identifier for an application to be tested, a machine learning model can be generated that can be used to automate exploratory testing of the application. The machine learning model can be generated based on test scenarios associated with the application and user interface controls of the application. The machine learning model can comprise one or more data structures that model relationships between user interface control values and application functionality defined by the test scenarios. The machine learning model can be used to generate exploratory testing operations targeting the application. In at least some embodiments, the machine learning model comprises an artificial neural network comprising input layer nodes associated with user interface controls and/or hidden layer nodes associated with application test scenarios.