The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Mar. 04, 2020
Applicant:
Micro Focus Llc, Santa Clara, CA (US);
Inventors:
Jun-Chen Peng, Shanghai, CN;
Xiang Gao, Shanghai, CN;
Kai Long, Shanghai, CN;
Ruixiang Chen, Shanghai, CN;
Lingli Wu, Shanghai, CN;
Assignee:
MICRO FOCUS LLC, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/30 (2018.01); G06F 9/38 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3676 (2013.01); G06F 9/3005 (2013.01); G06F 9/3842 (2013.01); G06F 11/3684 (2013.01); G06F 11/3692 (2013.01);
Abstract
A test script is divided into tests having a sequential order within the test script. An analysis tree of the tests can be generated. Each unique path through the analysis tree includes a subset of the tests as sequentially ordered within the test script. A maximally parallel subset of the unique paths that covers all the tests and according to which the tests are successfully executable is identified. Each test appears in only one unique path of the maximally parallel subset.