The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Jan. 28, 2020
Ebay Inc., San Jose, CA (US);
Sarang Mukund Kulkarni, Folsom, CA (US);
Timothy David Robison, Orangevale, CA (US);
Steven Bruce West, Roseville, CA (US);
Sami Ben Romdhane, Los Altos, CA (US);
Douglas Wayne Hathaway, El Dorado Hills, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
Defects are identified in a pre-production version of an application. Input used to test the pre-production version is derived from input received by a production version of the application. Input to the production version may be selectively filtered and/or amplified before being provided as test input to the pre-production version. In this way, the makeup and rate of the test input can be controlled while maintaining the character, pattern, and unpredictable nature of real-world input. Defects may be identified when the test input causes the pre-production version to crash, hang, write to an error log, or otherwise manifest or report a malfunction. In addition to identifying defects, filtered and amplified input may also be used to perform regression testing, load testing, performance testing, etc.