The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jan. 10, 2020
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Soumya Basu, Ithaca, NY (US);

Alin Tomescu, Cambridge, MA (US);

Dahlia Malkhi, Palo Alto, CA (US);

Michael Reiter, Palo Alto, CA (US);

Adrian Seredinschi, Lausanne, CH;

Ittai Abraham, Tel Aviv, IL;

Guy Golan Gueta, Holong, IL;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1469 (2013.01); H04L 9/085 (2013.01); H04L 9/0869 (2013.01); H04L 9/0894 (2013.01); G06F 2201/805 (2013.01); G06F 2201/82 (2013.01);
Abstract

Techniques for implementing Byzantine fault tolerance with verifiable secret sharing at constant overhead are provided. In one set of embodiments, a client can determine a secret value s to be shared with N replicas in a distributed system, s being input data for a service operation provided by the N replicas. The client can further encode s into an f-degree polynomial P(x) where f corresponds to a maximum number of faulty replicas in the distributed system, evaluate P(x) at i for i=1 to N resulting in N evaluations P(i), generate at least one f-degree recovery polynomial R(x) based on a distributed pseudo-random function (DPRF) f(x), and evaluate R(x) at i for i=1 to N resulting in at least N evaluations R(i). The client can then invoke the service operation, the invoking comprising transmitting a message including P(i) and R(i) to each respective replica i.


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