The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jun. 21, 2019
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventor:

Deokwoo Jung, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06K 9/62 (2022.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06K 9/6224 (2013.01); G06K 9/6277 (2013.01); G06N 7/005 (2013.01);
Abstract

One embodiment of the present invention can provide a system for identifying a root cause of an anomaly event in operation of one or more machines is provided. During operation, the system can obtain sensor data from a set of sensors associated with the one or more machines, convert the sensor data into a set of sensor states, build an optimal DAG based on the set of sensor states to model causal dependency; determining, by using the DAG, a probability of an anomaly state of a target sensor given a state of a direct neighbor sensor, and determining a root cause of the anomaly event associated with the target sensor by back-tracking the anomaly state in the DAG.


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