The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Aug. 03, 2018
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Osamu Nasu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G05B 23/02 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0229 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A data analysis device () according to the present disclosure includes a data collector () and a data organizer (). The data collector () collects an input signal that is input from an apparatus connected to the data analysis device (). The data organizer () removes, from among waveforms included in the input signal collected by the data collector (), a waveform that has an appearance frequency lower than a reference frequency. The data organizer () generates learning data by collecting, from among the waveforms included in the input signal, waveforms that have an appearance frequency higher than the reference frequency.


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Nasu, Osamu. (2022). Data analysis device, system, method, and recording medium storing program (U.S. Patent No. 11353860). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11353860

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