The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Mar. 19, 2019
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Jing Zhang, Weymouth, MA (US);
Daniel Nikovski, Brookline, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A system for detecting an anomaly in an execution of an operation of a machine determines a local matrix profile (LMP) of a test signal with respect to the baseline signals. LMP is a time series of values, each LMP value for a time instance is determined for a segment of the test signal based on a minimum distance between the segment of the test signal with corresponding segments of the baseline signals, such that each LMP value is a value of a local dissimilarity of the execution of the operation of the machine with respect to the baseline executions of the operation of the machine. The system determines an accumulation of the LMP values above an LMP threshold and detects an anomaly when the accumulation above an anomaly detection threshold.