The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Oct. 09, 2018
Applicant:

Luminar, Llc, Orlando, FL (US);

Inventors:

Scott R. Campbell, Sanford, FL (US);

Matthew D. Weed, Orlando, FL (US);

Lane A. Martin, Sunnyvale, CA (US);

Jason M. Eichenholz, Orlando, FL (US);

Austin K. Russell, Orlando, FL (US);

Assignee:

Luminar, LLC, Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 17/08 (2006.01); G01S 7/4865 (2020.01); G01S 7/48 (2006.01); G01S 17/42 (2006.01); G01S 17/931 (2020.01); G01S 17/89 (2020.01); G02B 26/10 (2006.01); G01S 17/10 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01S 7/4802 (2013.01); G01S 7/4808 (2013.01); G01S 7/4865 (2013.01); G01S 17/08 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01); G02B 26/10 (2013.01); G01S 17/10 (2013.01);
Abstract

In one embodiment, a lidar system includes a light source configured to emit pulses of light and a scanner configured to scan at least a portion of the emitted pulses of light along a scan pattern contained within an adjustable field of regard. The scanner includes a first scanning mirror configured to scan the portion of the emitted pulses of light substantially parallel to a first scan axis to produce multiple scan lines of the scan pattern, where each scan line is oriented substantially parallel to the first scan axis. The scanner also includes a second scanning mirror configured to distribute the scan lines along a second scan axis that is substantially orthogonal to the first scan axis, where the scan lines are distributed within the adjustable field of regard according to an adjustable second-axis scan profile.


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