The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Aug. 19, 2019
Keysight Technologies, Inc., Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
Alex Grichener, Plymouth, MN (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A method is provided for calibrating a test system, including an RF source combined with a VNA connected to or embedded in a test instrument. The method includes connecting to a power meter at the test port; generating an RF signal at an RF source as an incident signal, and providing the incident signal to the power meter through the test port; measuring a forward power wave of the incident signal using a first receiver; measuring a reverse power wave of a reflected signal using a second receiver; measuring output power at the test port using the power meter; and calculating magnitude errors of the first receiver and the second receiver using the measured forward power wave, the measured reverse power wave, and the measured output power by the power meter, and determining magnitude error correction terms of the forward and reverse power waves to remove the magnitude errors.