The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Oct. 10, 2018
Sintef Tto As, Trondheim, NO;
Sverre Knudsen, Oslo, NO;
Matthieu Lacolle, Nesøya, NO;
Øyvind Nistad Stamnes, Oslo, NO;
Sigbjørn Kolberg, Oslo, NO;
Zeljko Skokic, Oslo, NO;
Magnus Blihovde Hjelstuen, Oslo, NO;
Jo Gjessing, Oslo, NO;
Andreas Vogl, Oslo, NO;
Ib-Rune Johansen, Oslo, NO;
SINTEF TTO AS, Trondheim, NO;
Abstract
A field detector () comprises a field-responsive element () which undergoes a dimensional change when exposed to a predetermined field; and an interferometric read-out arrangement arranged to detect the dimensional change of the field-responsive element. A light source () is arranged to provide a measurement beam reflected from the field-responsive element () and a reference beam not reflected from the field-responsive element (), an optical detector () being disposed so as to detect at least part of an interference pattern produced by the measurement beam and the reference beam. The field-responsive element () has a shape comprising a curved surface and is constrained at least one edge () thereof such that the dimensional change causes the curved surface to be displaced in a direction which changes an optical path length of the measurement beam relative to the reference beam, thereby changing the interference pattern detected by said optical detector.