The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Sep. 24, 2020
Applicant:

Stmicroelectronics SA, Montrouge, FR;

Inventor:

Ricardo Gomez Gomez, Grenoble, FR;

Assignee:

STMICROELECTRONICS SA, Montrouge, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3177 (2006.01); G06F 11/267 (2006.01); G06F 11/16 (2006.01); G06F 11/18 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318566 (2013.01); G01R 31/3177 (2013.01); G06F 11/1629 (2013.01); G06F 11/183 (2013.01); G06F 11/267 (2013.01); G01R 31/31816 (2013.01);
Abstract

A method tests a plurality of devices, each device including a test chain having a plurality of positions storing test data. The testing includes comparing test data in a last position of the test chain of each of the devices. The test data in the test chains of the devices is shifted forward by one position. The shifting includes writing test data in the last position of a test chain to a first position in the test chain. The comparing and the shifting are repeated until the test data in the last position of each test chain when the testing is started is shifted back into the last position of the respective test chain. The plurality of devices may have a same structure and a same functionality.


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