The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Sep. 17, 2019
Applicant:

Amotech Co., Ltd., Incheon, KR;

Inventors:

Jongho Park, Namwon-si, KR;

Hyungil Baek, Yongin-si, KR;

Chanwoo Lee, Yongin-si, KR;

Assignee:

AMOTECH CO., LTD., Incheon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/0878 (2013.01); G01R 29/105 (2013.01);
Abstract

Disclosed is herein an antenna performance tester including: a horizontal rotorrotatable about a shaft partto which a DUT holderis detachably coupled; and a vertical rotorto which a reference antenna holderis detachably fixed and which is spaced apart from a side surface of the DUT holder, is installed perpendicular to the horizontal rotor, and is rotatable about a virtual central point lying at the center. The antenna performance tester is advantageous in that: a reference antenna measures an RF while performing transmission and reception with respect to a DUT in all directions at a constant distance from the DUT; extension and replacement are possible depending on a frequency to be measured; and an influence of reflected waves is minimized at RF measurement, antenna performance can be simply tested in an anechoic chamber or even in a semi-anechoic chamber.


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