The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Nov. 22, 2017
Applicant:

National Institute for Materials Science, Ibaraki, JP;

Inventors:

Gaku Imamura, Tsukuba, JP;

Genki Yoshikawa, Tsukuba, JP;

Takashi Washio, Suita, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 19/00 (2006.01); G01N 29/46 (2006.01); G01N 29/02 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0027 (2013.01); G01N 19/00 (2013.01); G01N 29/022 (2013.01); G01N 29/4418 (2013.01); G01N 29/46 (2013.01);
Abstract

Provided is a novel analysis method that enables identification of a sample even when any sample is introduced during measurement carried out by using a chemical sensor. An input in which the amount of an unknown sample changes over time is provided to the chemical sensor, a response which is from the chemical sensor and which changes over time is measured, a sensor function (transmission function) of the chemical sensor with respect to the unknown sample is calculated on the basis of the input and the response, and the unknown sample is identified on the basis of the sensor function of the chemical sensor with respect to the unknown sample.


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