The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jan. 25, 2018
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventors:

Toshiro Sakamoto, Tokyo, JP;

Takaaki Furuya, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/42 (2006.01); G01N 21/47 (2006.01); G02F 1/295 (2006.01); G02B 6/125 (2006.01); G01N 21/552 (2014.01); G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/552 (2013.01); G01N 21/3504 (2013.01); G01N 21/4788 (2013.01); G02B 6/125 (2013.01); G02B 6/4203 (2013.01); G02F 1/2955 (2013.01);
Abstract

It is an object of this invention to provide an optical waveguide, an optical concentration measuring device, and a method for manufacturing an optical waveguide capable of achieving an improvement of evanescent wave exuding efficiency of propagating light and light extraction efficiency. A core layer provided in an optical waveguide has a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting the first portion and the second portion. The third portion is formed so that the film thickness is gradually increased from the second portion having the smaller film thickness toward the first portion having the larger film thickness between the first portion and the second portion, and the maximum inclination angle is 10° or more and 45° or less.


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