The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Dec. 16, 2020
Samsung Electronics Co., Ltd., Suwon-si, KR;
Alexey Grigorievich Anikanov, Moscow, RU;
Tatiana Igorevna Kopysova, Perm, RU;
Pavel Aleksandrovich Ivshin, Moscow region, RU;
Alexey Dmitrievich Lantsov, Moscow region, RU;
Vasily Victorovich Grigorev, Moscow, RU;
Maxim Vladimirovich Ryabko, Moscow region, RU;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A system for extraction of optical properties of a turbid medium by using diffuse reflectometry may include at least one light source, an optical receiver, at least one separator, and at least one processor configured to control the optical receiver, while the radiation is provided to the turbid medium in the radiation input area of the at least one light source, to sequentially open each LC cell from the array of LC cells, and simultaneously receive radiation, passed through the sequentially opened LC cells and corresponding microlenses, by corresponding photodetectors from the array of photodetectors to obtain the distribution of radiation intensity; and extract the optical properties of the turbid medium based on the distribution of radiation intensity.