The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Feb. 15, 2019
Applicant:
Maschinenfabrik Rieter Ag, Winterthur, CH;
Inventors:
Evzen Pilar, Litomysl, CZ;
Bernd Bahlmann, Schrobenhausen, DE;
Assignee:
Maschinenfabrik Rieter AG, Winterthur, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D01H 13/26 (2006.01); G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
D01H 13/26 (2013.01); G01N 21/8915 (2013.01);
Abstract
A device for contactless measurement of one or more parameters of a linear textile formation (e.g., yarn) includes a yarn sensor with at least two mutually independent detection zones for one or a combination of the parameters of yarn presence, yarn movement, or yarn quality. The individual detections zones are arranged in defined positions relative to at least two different yarn paths of the yarn at a workstation depending on changed states of the yarn at the workstation so that at least one of the parameters is measured in each of the detections zones.