The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Nov. 13, 2015
Applicant:

Institute for Basic Science, Daejeon, KR;

Inventors:

Jin Soo Kim, Seoul, KR;

Dae Sik Kim, Incheon, KR;

Sang Su Bae, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6874 (2018.01); C12N 9/22 (2006.01); C12Q 1/686 (2018.01); C12Q 1/6806 (2018.01); G16B 30/00 (2019.01); G16B 30/10 (2019.01);
U.S. Cl.
CPC ...
C12Q 1/6874 (2013.01); C12N 9/22 (2013.01); C12Q 1/686 (2013.01); C12Q 1/6806 (2013.01); G16B 30/00 (2019.02); G16B 30/10 (2019.02);
Abstract

The present disclosure relates to a method for detecting off-target sites of a programmable nuclease in a genome, and specifically, to a method for detecting off-target sites through data analysis by subjecting the genome isolated in vitro to programmable nucleases to cleave the genome and then performing whole genome sequencing or deep sequencing, and to a method for selecting on-target sites of a programmable nuclease, which minimizes the off-target effect, using this method. The Digenome-seq of the present disclosure can detect the off-target sites of a programmable nuclease on the genomic scale at a high degree of reproducibility, and thus can be used in the manufacture of programmable nucleases having high target specificity and the study thereof.


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