The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jun. 25, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Seiji Uozumi, Tokyo, JP;

Nobuhiro Shinohara, Tokyo, JP;

Daiji Morita, Tokyo, JP;

Nobuyuki Sumi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 50/02 (2015.01); B33Y 30/00 (2015.01); B33Y 10/00 (2015.01); B29C 64/393 (2017.01); G05B 19/4093 (2006.01); B29C 64/268 (2017.01); B29C 64/153 (2017.01); B23K 26/342 (2014.01); G05B 19/40 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B23K 26/342 (2015.10); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G05B 19/40931 (2013.01); G05B 2219/33034 (2013.01); G05B 2219/49013 (2013.01);
Abstract

An NC device, which is a numerical control device, includes: a program analyzing unit that analyzes a machining program to obtain a movement path along which to move a supply position of a material on a workpiece; a storage temperature extracting unit that extracts, from data on surface temperature of the workpiece, storage temperature in an area including the movement path on the workpiece; a layering volume calculating unit that calculates a volume of a layer forming an object on the basis of a relation between the storage temperature and a volume of the material that solidifies at the storage temperature in a given time; and a layering shape changing unit that changes a shape of the layer on the basis of the volume of the layer.


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