The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Nov. 22, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Rafael Wiemker, Kisdorf, DE;
Andriy Yaroshenko, Garching, DE;
Karsten Rindt, Hamburg, DE;
Jörg Sabczynski, Norderstedt, DE;
Thomas Koehler, Norderstedt, DE;
Hanns-Ingo Maack, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to an apparatus () for presentation of dark field information. It is described to provide () an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (). A plurality of sub-regions of the region of interest are defined () based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived () for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned () to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region. Data representative of the region of interest is output () with figures of merit for the respective sub-regions.