The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
May. 20, 2019
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Woo-Shik Kim, San Diego, CA (US);
Do-Kyoung Kwon, Allen, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/91 (2014.01); H04N 19/176 (2014.01); H04N 19/117 (2014.01); H04N 19/14 (2014.01); H04N 19/82 (2014.01); H04N 19/182 (2014.01); H04N 19/80 (2014.01);
U.S. Cl.
CPC ...
H04N 19/91 (2014.11); H04N 19/117 (2014.11); H04N 19/14 (2014.11); H04N 19/176 (2014.11); H04N 19/182 (2014.11); H04N 19/80 (2014.11); H04N 19/82 (2014.11);
Abstract
A method and apparatus for sample adaptive offset without sign coding. The method includes selecting an edge offset type for at least a portion of an image, classifying at least one pixel of at least the portion of the image into edge shape category, calculating an offset of the pixel, determining the offset is larger or smaller than a predetermined threshold, changing a sign of the offset based on the threshold determination; and performing entropy coding accounting for the sign of the offset and the value of the offset.