The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Apr. 03, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Te Tang, Fremont, CA (US);

Tetsuaki Kato, Fremont, CA (US);

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/275 (2018.01); G06K 9/00 (2022.01); H04N 13/25 (2018.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
H04N 13/275 (2018.05); G06V 20/653 (2022.01); H04N 13/25 (2018.05); G06T 2207/10012 (2013.01);
Abstract

A system and method for obtaining a 3D pose of an object using 2D images from multiple 2D cameras. The method includes positioning a first 2D camera so that it is directed towards the object along a first optical axis, obtaining 2D images of the object by the first 2D camera, and extracting feature points from the 2D images from the first 2D camera using a first feature extraction process. The method also includes positioning a second 2D camera so that it is directed towards the object along a second optical axis, obtaining 2D images of the object by the second 2D camera, and extracting feature points from the 2D images from the second 2D camera using a second feature extraction process. The method then estimates the 3D pose of the object using the extracted feature points from both of the first and second feature extraction process.


Find Patent Forward Citations

Loading…