The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Oct. 06, 2020
Applicant:

Sunpower Corporation, San Jose, CA (US);

Inventors:

Katherine Han, San Jose, CA (US);

Jack Stewart, Forest Grove, OR (US);

Hai-Yue Han, San Jose, CA (US);

Assignee:

SunPower Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02S 50/10 (2014.01); H02S 40/34 (2014.01); G01R 31/08 (2020.01); G01R 31/11 (2006.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); G01R 31/086 (2013.01); G01R 31/11 (2013.01); H02S 40/34 (2014.12);
Abstract

Testing to detect intermittent electrical pathways is described. Applied currents may be reversed to fully test all components of a workpiece. Various testing methodologies may be employed. These methodologies may include Time Domain Reflectometry (TDR), mechanical agitation, dark current/voltage testing, (dark IV), i.e., electrical testing of a workpiece using applied electricity, and thermographic imaging, e.g., infra-red thermal imaging. The sensed voltage during agitation may be compared to a benchmark voltage to determine whether or not an intermittent failure exists.


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