The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Dec. 31, 2020
Applicant:
Tempus Labs, Inc., Chicago, IL (US);
Inventors:
Stephen Yip, Chicago, IL (US);
Irvin Ho, Wilmette, IL (US);
Lingdao Sha, Chicago, IL (US);
Boleslaw Osinski, Chicago, IL (US);
Aly Azeem Khan, Chicago, IL (US);
Andrew J. Kruger, Chicago, IL (US);
Michael Carlson, Chicago, IL (US);
Abel Greenwald, Chicago, IL (US);
Caleb Willis, Chicago, IL (US);
Andrew Westley, Chicago, IL (US);
Ryan Jones, Naperville, IL (US);
Brett Mahon, Chicago, IL (US);
Assignee:
TEMPUS LABS, INC., Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 30/00 (2019.01); G16B 50/30 (2019.01); C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
G16B 30/00 (2019.02); C12Q 1/6869 (2013.01); G16B 50/30 (2019.02); C12Q 2535/101 (2013.01);
Abstract
A method for qualifying a specimen prepared on one or more hematoxylin and eosin (H&E) slides by assessing an expected yield of nucleic acids for tumor cells and providing associated unstained slides for subsequent nucleic acid analysis is provided.